Electrostatic Force Microscope (EFM)
It is a surface potential distribution measurement system of the scanning probe microscope type with a cantilever having a tip size of 5μm x 5μm.
It is possible to measure very fine surface potential distributions of about 10μm, which could not be measured with conventional surface potential meters, and it allows for scanning of very wide areas of about several millimeters. It can measure voltages of ±1000V with high precision of 0.5%.
- Company：ウエストワン
- Price：Other
